Resistivity of Semiconductors by Four Probe Method at Differnt Temperatures and Determination of Band-Gap |
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| Resistivity of Semiconductors by Four Probe Method at Differnt Temperatures and Determination of Band-Gap
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| The experiment consists of the following :
(i)
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Four Probe Arrangement |
(ii)
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Oven (upto 200ºC) |
(iii)
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Sample : Ge Crystal mounted |
(iv)
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Thermometer (0-200ºC) |
(v) |
Four Probe Setup |
(a)
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Constant Current power supply digital Accuracy : +0.25% of the reading +1 digit Load Regulation : 0.03% for no load to full load |
(b) |
Electronic Millivoltmeter 200 mV Accuracy : + 0.1% of reading = 1 digit Impedence : 1 Mohm |
Display : 3½ digit, 7 segment LED (12.5mm) height with auto polarity and decimal indication.
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